Ernst Leitz Wetzlar GmbH
Patent Owner
Stats
- 0 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Jun 18, 1991 most recent publication
Details
- 0 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 1,387 Total Citation Count
- Jun 14, 1976 Earliest Filing
- 129 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
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Recent Publications
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Recent Patents
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Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
5025147 Sensor for converting a distance to optical and further to electrical energy, and surface scanning apparatus using sameExpiredSep 22, 88Jun 18, 91[H01J]
4889548 Use of an oxide ceramic material for compression molds for shaping elements made from glass or a glass-containing ceramic and having high surface quality and dimensional accuracyExpiredJan 06, 88Dec 26, 89[C03B]
4881802 Combined bright field-dark field incident light illumination apparatusExpiredMay 03, 88Nov 21, 89[G02B]
4881897 Tooth-root implant with long-term resistance to repetitive stressesExpiredJan 07, 88Nov 21, 89[A61C]
4868128 Process for dry dispersal of particles, and a device for carrying out this processExpiredAug 20, 87Sep 19, 89[G01N]
4830655 High temperature-resistant material for devices used for forming glass optical elements with high surface qualityExpiredJun 09, 87May 16, 89[C03B]
4816664 Focusing detector having a scanning grating used both as a beam splitter and spatial and frequency filterExpiredOct 22, 86Mar 28, 89[G01J]
4814814 Process and device for the introduction, visualization and/or recording of a variable metering spot into a ray path of a camera for optical instrumentsExpiredJun 01, 88Mar 21, 89[G03B]
4798948 Field stop for dark field illumination in autofocus optical deviceExpiredApr 17, 87Jan 17, 89[G01J]
4796999 Device for automatically determining the deviation between the structures of a pattern and those of an object compared therewithExpiredJan 16, 87Jan 10, 89[G01B]
4758731 Method and arrangement for aligning, examining and/or measuring two-dimensional objectsExpiredJan 12, 87Jul 19, 88[G03B, G03F]
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